Force spectroscopy

Results: 165



#Item
121Chemistry / Condensed matter physics / Nanomaterials / Intermolecular forces / Kelvin probe force microscope / Surface chemistry / Electrostatic force microscope / Nanorod / Atomic force microscopy / Physics / Scanning probe microscopy / Science

Field Enhancement and Work Function Difference of IrO2 Nano-Emitter Arrays using EFM and SKPM Spectroscopy D. C.-S. Chiang*, Z.-F.P. Lei* , R. Barrowcliff**, F. Zhang** * Washington State University Vancouver, WA 98686,

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Source URL: www.nsti.org

Language: English - Date: 2012-06-27 17:06:43
122Chemistry / Atomic force microscopy / Nanotechnology / Cantilever / Force spectroscopy / Magnetic force microscope / Scanning probe microscopy / Science / Scientific method

Two-Dimensional Fine Particle Positioning Under Optical Microscope Using a Piezoresistive Cantilever as a Manipulator Metin Sitti and Hideki Hashimoto Institute of Industrial Science, University of Tokyo,

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Source URL: nanolab.me.cmu.edu

Language: English - Date: 2012-11-16 19:15:37
123Nanotechnology / Nanomaterials / Metamaterials / Optics / Spectroscopy / Surface plasmon resonance / Surface enhanced Raman spectroscopy / Plasmon / Colloidal gold / Physics / Science / Chemistry

169 Index a Atomic force microscopy (AFM) 113–115,

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Source URL: www.wiley-vch.de

Language: English - Date: 2014-07-07 21:03:23
124Electron microscopy / Microscopy / Spectroscopy / Raman spectroscopy / Electron microscope / Mass spectrometry / Atomic force microscopy / Scanning electron microscope / Analytical chemistry / Scientific method / Science / Chemistry

FR AUNHOFER INSTITUTE FOR INTERFACIAL ENGINEERING AND BIOTECHNOLOGY IGB SURFACE ANALYTICS PROCESS ANALYTICS, FAULT ANALYSES, PRODUCT DEVELOPMENT, QUALITY CONTROL hν

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Source URL: www.igb.fraunhofer.de

Language: English - Date: 2015-01-15 15:07:53
125Scanning probe microscopy / Spectroscopy / Force spectroscopy / Atomic force microscopy / Adhesion / Humidity / Van der Waals force / Microscopy / Properties of water / Chemistry / Intermolecular forces / Science

Microsoft Word - 3_Lab_Unit_FD.doc

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Source URL: depts.washington.edu

Language: English - Date: 2009-07-20 14:30:46
126Scanning probe microscopy / Diffraction / Emerging technologies / Microscopes / Spectroscopy / Scanning tunneling microscope / Quantum dot / Reflection high-energy electron diffraction / Atomic force microscopy / Science / Scientific method / Chemistry

APPLIED PHYSICS LETTERS 86, 033103 共2005兲 Probing the size and density of silicon nanocrystals in nanocrystal memory device applications Tao Feng,a兲 Hongbin Yu, Matthew Dicken, James R. Heath, and Harry A. Atwater

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Source URL: daedalus.caltech.edu

Language: English - Date: 2006-10-31 04:02:21
127Scientific method / Scanning tunneling microscope / Microscopy / Electron / Spectroscopy / Scanning tunneling spectroscopy / Conductive atomic force microscopy / Scanning probe microscopy / Physics / Science

Microsoft Word - 5_Lab_Unit_STM.doc

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Source URL: depts.washington.edu

Language: English - Date: 2009-07-20 14:30:48
128Chemistry / Atomic force microscopy / Microscopy / Scanning tunneling microscope / Microscope / Force spectroscopy / Dip-pen nanolithography / Magnetic force microscope / Vibrational analysis with scanning probe microscopy / Scanning probe microscopy / Science / Scientific method

Microsoft Word - 1_Lab_Unit_IntroSFM.doc

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Source URL: depts.washington.edu

Language: English - Date: 2009-07-20 14:30:44
129Chemical kinetics / Ribozymes / Biomolecules / Protein structure / Nuclear magnetic resonance spectroscopy / Nuclear magnetic resonance / Force field / Protein / DNA / Biology / Chemistry / RNA

Chemical & Engineering News - Cover Story[removed]Chemistry Highlights[removed]:03 PM ACS Journals

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Source URL: salilab.org

Language: English - Date: 2008-03-21 18:47:19
130Scanning probe microscopy / Magnetic resonance force microscopy / Nuclear magnetic resonance / Protein structure / Electromagnetism / Spectroscopy / Resonator / Resonance / Electrical resonance / Physics / Scientific method / Science

ARTICLE IN PRESS Journal of Magnetism and Magnetic Materials[removed]–328 www.elsevier.com/locate/jmmm Light-free magnetic resonance force microscopy for studies of

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Source URL: www.kschwabresearch.com

Language: English - Date: 2007-07-15 18:41:54
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